There are two main types of electron microscopes: transmission electron microscopes (TEM) and scanning electron microscopes (SEM). A TEM allows the observation of thin sections of samples, with the electron beam penetrating the sample (comparable to the transmitted light microscope in light microscopy), while with SEM the surface structure of samples is imaged (comparable to the reflected light microscope in light microscopy).

Both the TEM and the SEM offer a wide range of analysis methods for topography, element distribution and crystal structure analysis. You can find out more from the contact persons for the initial consultation.